Applicazioni Semiconduttori
Okos - VUE 400P
Scanning Acustic Microscope Semiconductor Package Failure Analysis:VoidsDisbondsCracksDelaminationInternal defects Customer Interface:Dual 22” H…
Okos - VUE 250P
Scanning Acustic Microscope Semiconductor Package Failure Analysis:VoidsDisbondsCracksDelaminationInternal defects Customer Interface:Dual 22” H…
Okos - Solar Panel Inspection Scanner
Custom engineered for inspecting Solar Panels, MACROVUE accommodates all size panels, and allows detection of: Bond integrity between glass and PV mat…
Okos - UT NDT System per Tubature
UT NDT System for Pipe, Tube & Billet Inspection
Okos - NDT-CF 300
Multi Axes NDT Scanner Compact Footprint Controllo NDT ad ultrasuoni di:Materiali duriCompositiLeghe personalizzateGiunti di saldaturaPlasticaCircuiti…

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